ICID - Tracing Individual Die from Wafer Test through End-Of-Life
نویسندگان
چکیده
ICID (Integrated Circuit IDentification) is a small mixed-signal cell that can be added to the test logic on a CMOS integrated circuit. It provides a unique 224 bit identification number that can be accessed during die test. This identification can be used to correlate test information for individual die on the wafer, through package test, and into the field and back. The identification bits are produced from the fixed analog mismatch of an array of PFET pairs, and does not require process modifications or programming. LSI Logic is using ICID technology to trace individual die through test, and correlate test statistics from wafer test, package test, and failure analysis.
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